2012 Letters in Reliability: Call for Contribution

The Letters in Reliability (formerly Annual Technology Report) of the IEEE Reliability Society is based on material submitted by the technical activity segments of the Society, statements from experts in the field, industry reviews, and current special interest groups working in the field.

Articles are solicited that address reliability and related assurance topics, covering recent innovations and advancements of emerging hot topics, as well as new and revisited techniques and methodologies, experiences and practices, case studies and benchmarks, and insights or recommendations. Special welcome is extended to those addressing technical issues on topics such as system, software, and hardware/device reliability, PHM (Prognostics and Health Management), security, trust, safety, human-system interface, maintainability, and supportability. Also of interest are papers on technological solutions to potential disasters or risks, lessons-learned from past events or trends, cloud computing, smartphone applications, and Internet of Things.

Contributions to LIR will be classified into different categories including experience reports, best practices, research results, benchmarks & standards, etc. Although there is no page limit on each submission, they should be written, following the standard IEEE one-column format, in a clear and concise way with a focused subject. The top of the first page should list the email address and affiliation of each author with a superscript * associated with the corresponding author.

Starting from 2012, no email submission will be accepted. Authors should upload their articles to the designated EasyChair website: https://www.easychair.org/conferences/?conf=lir2012. See the login page in Figure 1.

Figure 1. Submission site for Letters in Reliability

This site will be open for submission on a continuous basis. Each submission will only be lightly reviewed to ensure a fast turnaround between submission and acceptance. Those accepted before December 31 will be included in the 2012 Letters in Reliability; others go to the 2013 edition. However, each article after being accepted will be immediately posted at the IEEE Reliability Society web site. Subsequent updates are welcomed even after publication.

Past issues can be accessed by navigating to http://rs.ieee.org/publications.html and clicking on the "Annual Technology Report" button on the left. The following figure shows the list of articles for the 2011 edition.

Figure 2: Web page for the 2011 Reliability Society Annual Technology Report

For any inquiry, please send email to Professor Eric Wong, Vice President for Technical Activities, at ewong@utdallas.edu.